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Proceedings Paper

Thermal management for CCD peformance of one space telescope
Author(s): Wengang Yang; Yinghao Wang; Liangjie Feng; Chenjie Wang; Guorui Ren; Wei Wang; Chuang Li; Wei Gao; Xuewu Fan
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Paper Abstract

A space telescope containing two CCD cameras is being built for scientific observation. The CCD detectors need to operate at a temperature below -65°C in order to avoid unacceptable dark current. This cooling is achieved through detailed thermal design which minimizes the parasitic load to 2K×4K array with 13.5 micron pixels and cools this detector with a combination of thermo electric cooler(TEC). This paper will describe detailed thermal design necessary to maintain the CCD at its cold operating temperature while providing the means to reject the heat generated by the TECs. It will focus on optimized techniques developed to manage parasitic loads including material selection, surface finishes and thermal insulation. The paper will also address analytical techniques developed to characterize TEC performance. Finally, analysis results have been shown the temperature of key parts.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200P (15 October 2012); doi: 10.1117/12.971510
Show Author Affiliations
Wengang Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Yinghao Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Liangjie Feng, Xi'an Institute of Optics and Precision Mechanics (China)
Chenjie Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Guorui Ren, Xi'an Institute of Optics and Precision Mechanics (China)
Wei Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Chuang Li, Xi'an Institute of Optics and Precision Mechanics (China)
Wei Gao, Xi'an Institute of Optics and Precision Mechanics (China)
Xuewu Fan, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)

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