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Proceedings Paper

Experimental study of photo counting imaging based on APD
Author(s): Huiming Qu; Yuan-yuan Li; Dan Cao; Qi Zheng; Zhong-Jie Ji; Qian Chen
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Paper Abstract

Photo counting imaging is a promising imaging method for very low-level-light condition and super high-speed imaging. An experimental setup with Geiger mode silicon avalanche photodiode single-photon counter was established in this study. This experimental setup achieved photon counting imaging through serial two-dimensional scanning mode of single APD. It extracts the extremely weak signal from the noise by scanning image, and then reconstructs the photon distribution image. The feasibility of the experiment platform was verified with many experiments. The resolution bar was scanned and imaged in different lighting condition. A Lena image was also scanned and imaged among several illumination conditions. The resolution ability and imaging quality are evaluated in different illumination surroundings. The imaging limited condition was concluded based on existing APD sensor. The experimental result indicates that the imaging based Geiger mode APD is an excellent candidate for very low level light imaging.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 842011 (15 October 2012); doi: 10.1117/12.971449
Show Author Affiliations
Huiming Qu, Nanjing Univ. of Science and Technology (China)
Yuan-yuan Li, Nanjing Univ. of Science and Technology (China)
Dan Cao, Nanjing Univ. of Science and Technology (China)
Qi Zheng, Nanjing Univ. of Science and Technology (China)
Zhong-Jie Ji, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)

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