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Proceedings Paper

Research on method for improving measurement precision of CCD laser collimation system with adaptability to the environment
Author(s): Xiaofeng Zhao; He Chen; Zhili Zhang; Chuntong Liu
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Paper Abstract

Laser collimation System based on linear CCD is currently widely used in the area of high precision angle measurement. However, for some special application the collimation system would be used outside and in the complex environment. In these cases the precision of the current collimation system would be greatly reduced with the change of the light intensity of the environment. Therefore, it is necessary to research the method to improve measurement precision of laser collimation system under the complex environment. In this paper, based on the principle of CCD laser collimation the method for improving measurement precision of laser collimation system with adaptability to the environment is studied. The linear driving circuit of linear CCD TCD1208AP whose integration time can be automatically adjusted according to the change of the background intensity is designed based on CPLD. For the CCD output signal a new kind of mode of signal process is presented with which the threshold can be self-adaptable to the environment. The simulation has been carried out and the results have verified the effectiveness of the project.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841719 (15 October 2012); doi: 10.1117/12.971199
Show Author Affiliations
Xiaofeng Zhao, Xi’an Research Institute of High Technology (China)
He Chen, Xi’an Research Institute of High Technology (China)
Zhili Zhang, Xi’an Research Institute of High Technology (China)
Chuntong Liu, Xi’an Research Institute of High Technology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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