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Proceedings Paper

Design and analysis of hologram alignment mark
Author(s): Shijie Li; Fan Wu; Qiang Chen
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Paper Abstract

When testing an off-axis aspheric surface using Computer Generated Hologram (CGH), multiple combined CGH can not only test the off-axis aspheric surface but also align every element in test system. The alignment transmission CGH with a rectangle aperture, which produces an alignment mark at the designated point, can be used to align the off-axis aspheric surface and CGH. Hologram alignment mark is introduced firstly, then the design of hologram alignment mark is deduced in detail and a formula of calculating the position coordinate of every point on fringes is got. After that its diffraction characteristics are analyzed based on Fresnel diffraction theory, which is in line with Fraunhofer diffraction, and the effects of different length-width ratio of rectangle aperture are simulated. Finally an example of hologram alignment mark and its corresponding actual mark picture are given.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172G (15 October 2012); doi: 10.1117/12.971196
Show Author Affiliations
Shijie Li, Institute of Optics and Electronics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Fan Wu, Institute of Optics and Electronics (China)
Qiang Chen, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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