Share Email Print
cover

Proceedings Paper

Design of an IRFPA point-by-point bias calibration
Author(s): Wei He; Jian Lv; Yun Zhou; Yiying Du; Caideng Yu; Guangzhong Xie; Kai Yuan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Infrared focal plane array (IRFPA) is a key component in infrared system and thermal imaging devices, widely applied in military and civilian fields, with a huge market potential and prospects. IRFPA readout circuit technology and test technology in its research occupies an important position, related to the ability to accurately and efficiently obtain the IRFPA signal and the ability of IRFPA devices for accurate performance evaluation. This paper uses an IRFPA point-by-point bias calibration, through a series of accurate timing control signals to read and save the calibration data and external input, effectively increases the point-by-point bias control accuracy, and finally improves the quality of the output image.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84192A (15 October 2012); doi: 10.1117/12.971176
Show Author Affiliations
Wei He, Univ. of Electronic Science and Technology of China (China)
Jian Lv, Univ. of Electronic Science and Technology of China (China)
Yun Zhou, Univ. of Electronic Science and Technology of China (China)
Yiying Du, Univ. of Electronic Science and Technology of China (China)
Caideng Yu, Univ. of Electronic Science and Technology of China (China)
Guangzhong Xie, Univ. of Electronic Science and Technology of China (China)
Kai Yuan, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Junsheng Yu; Zhifeng Wang, Editor(s)

© SPIE. Terms of Use
Back to Top