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Proceedings Paper

Beam And Spot Profile Measurement Methods For Optical Storage Systems
Author(s): Scott D. Wilson; Timothy Reed
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Paper Abstract

Convenient measurements of the spatial dimensions of propagating laser beams and submicron focused spots are described, applicable to optical storage systems. Methods for determining accuracy are discussed, together with error analyses. Examples of typical beam and focused spot measurements are presented including Gaussian, non-Gaussian and aberrated spots.

Paper Details

Date Published: 8 February 1985
PDF: 10 pages
Proc. SPIE 0499, Optical Radiation Measurements, (8 February 1985); doi: 10.1117/12.971075
Show Author Affiliations
Scott D. Wilson, Storage Technology Corporation (United States)
Timothy Reed, Storage Technology Corporation (United States)

Published in SPIE Proceedings Vol. 0499:
Optical Radiation Measurements
Aaron A. Sanders, Editor(s)

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