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Proceedings Paper

Attenuated Total Reflectance (ATR) And Reflection Absorption Infrared (RAMS) Spectroscopic Analysis Of Thin Films
Author(s): Richard W. Duerst; William A. Peters; W. E. Breneman; G. A. Kohler
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Paper Abstract

Attenuated total reflectance infrared spectroscopic (ATR-IR) analysis (also termed in ternal reflectance spectroscopy or Ins) of thin films coated on an internal reflectance element (IRE) should be considered a viable alternative to the reflection absorption infra-red spectroscopic (RAIRS) method, where thin films are coated an mirror surfaces, preliminary results have shown that reasonable, if not superior, spectra can be obtained for films as thin as 25 A (approximately a monolayer) coated on a germanium crystal.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970942
Show Author Affiliations
Richard W. Duerst, 3M Company (United States)
William A. Peters, 3M Company (United States)
W. E. Breneman, 3M Company (United States)
G. A. Kohler, 3M Company (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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