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Proceedings Paper

Characterization of Thin Films on Glassy Carbon Electrodes by Infrared External Reflection Spectroscopy
Author(s): Marc D. Porter; David L. Allara; Thomas B. Bright; Theodore Kuwana
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Paper Abstract

The utility of infrared external reflection spectroscopy [IR-ERS] for the characterization of thin organic surface structures on nonmetallic substrates, such as glassy carbon [GC], has been examined. Surface sensitivity as a function of the angle of incidence and polarization was determined by calculations of mean-square electric field values [MSEF1. Band shapes for IR-ERS spectra, obtained at optimum conditions for thin films (80-3500 A) of poly(methyl metharcylate) [PMMA] on GC, were severly distorted compared to those obtained with transmission spectroscopy. The IR-ERS spectra were accurately modeled (±1096) by classical electromagnetic theory, indicating that the distortions resulted from the inherent physical differences between ERS and transmission measurements.. These results also demonstrated the feasibility of performing quantitative IR-ERS at nonmetallic substrates.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970930
Show Author Affiliations
Marc D. Porter, Bell Communications Research (United States)
David L. Allara, Bell Communications Research (United States)
Thomas B. Bright, Bell Communications Research (United States)
Theodore Kuwana, The Ohio State University (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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