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Proceedings Paper

Experimental and theoretical characterization of surfaces using infrared reflectance spectroscopy
Author(s): David K. Ottesen; Lawrence R. Thorne; Robert W. Bradshaw
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Paper Abstract

External reflectance infrared spectroscopy has been used to study the formation of thin oxide films on metals. Experimental data have been acquired with a Fourier transform infrared (FT-IR) spectrometer using a polarized beam at high angles of incidence, and have been compared with theoretical calculations.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970929
Show Author Affiliations
David K. Ottesen, Sandia National Laboratories (United States)
Lawrence R. Thorne, Sandia National Laboratories (United States)
Robert W. Bradshaw, Sandia National Laboratories (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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