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Proceedings Paper

IR and Far IR Characterization of High Surface Materials and Adsorbed Species
Author(s): P. Hoffman; E. Knozinger
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Paper Abstract

This paper reports recent progress made in FTIR investigation of high surface materials such as SiO2 by means of the transmission technique. FTIR spectroscopy provides the following advantages: (a) Improved resolution makes the correct detection of band shapes of absorptions possible which are assigned to free surface OH groups. (b) Part of the finger print region and the total of the far IR range are now accessible. (c) Difference spectra allow the detec-tion of minute changes in the surface induced by variation of physical or chemical parameters.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970927
Show Author Affiliations
P. Hoffman, Universitat Siegen (Germany)
E. Knozinger, Universitat Siegen (Germany)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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