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Proceedings Paper

Lower Limit Of The Thickness Of The Measurable Surface Layer On Infrared Absorbing Substrate By FT-IR-ATR Spectroscopy
Author(s): Koji Ohta; Reikichi Iwamoto
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Paper Abstract

Based on verification of Harrick's relation between absorbances of absorption bands and the thickness of the surface layer probed in ATR spectroscopy, we have studied the lower limit of the thickness of a surface layer on an infrared absorbing substrate that can be measured by spectral subtraction of FT-IR-ATR spectra. Spectral observability of a surface layer of a thickness is predictable by comparing the expected absorbances of the bands of the surface layer with the detectable least signal increment obtainable from the noise level of a spectrometer. The limit of the thickness is, in general, 10 to 50 A for polymers.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970926
Show Author Affiliations
Koji Ohta, Government Industrial Research Institute of Osaka (Japan)
Reikichi Iwamoto, Government Industrial Research Institute of Osaka (Japan)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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