Share Email Print

Proceedings Paper

Spectral Directional Emittance Measurements In The Wavelength Range From 1 µm To 15 µm
Author(s): K. Gindele; M. Kohl; M. Mast
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

It is the spectral emittance which governs the thermooptical behaviour of surfaces and coatings. It is also the spectral emittance which causes the most serious measuring problems in characterizing coatings. In principle there are two methods: the measurement of the emitted thermal radiation of heated samples and the measurement of the reflectance of opaque samples ( E( X) = 1 - 9(X)). The determination of the reflectance requires the measurement of the radiation reflected into the whole hemisphere, since most of the investigated surfaces are reflecting diffusely. In the spectral range from 1 pm to about 15 μm this can be done with the aid of integrating spheres.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970873
Show Author Affiliations
K. Gindele, Universitat Stuttgart (Germany)
M. Kohl, Universitat Stuttgart (Germany)
M. Mast, Universitat Stuttgart (Germany)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

© SPIE. Terms of Use
Back to Top