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Proceedings Paper

Quality Control And Process Monitoring With FT-IR Spectroscopy
Author(s): G. L. Ritter; S. R. Lowry; C. R. Anderson
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Paper Abstract

The sensitivity and speed of FT-IR spectroscopy have always appealed to the quality control and process monitoring community. However, the high cost and large size of research grade instruments have limited the use of FT-IR in production environments. The development of smaller, more rugged spectrometers has created renewed interest in these applications. To meet the interest three areas become critical. •The spectrometer must have minimum down time and must be simple to service. • Quantitative analysis must be available so that an analysis may be configured easily. • It must be possible to transfer information from the spectrometer to a computer system for archiving or decision making.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970859
Show Author Affiliations
G. L. Ritter, Nicolet Instrument Corporation (United States)
S. R. Lowry, Nicolet Instrument Corporation (United States)
C. R. Anderson, Nicolet Instrument Corporation (United States)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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