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Proceedings Paper

Infrared Emission Spectroscopy: A New Accessory
Author(s): M. Handke; N. J. Harrick; J. L. Lauer; P. Vogel
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Paper Abstract

The principal problem in measurement of emission IR spectra is the low signal to noise ratio resulting from the large background radiation. One method of increasing the signal is to collect the emitted radiation over a very large solid angle using an ellipsoidal mirror. In this method, placing the sample at the short focal length of the ellipsoid both increases the amount of radiation collected for an improved signal to noise ratio as well as facilitates sampling of small areas. For locating the area of interest, a microscope is mounted on the emission accessory.

Paper Details

Date Published: 20 December 1985
PDF: 3 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970839
Show Author Affiliations
M. Handke, Harrick Scientific Corp. (United States)
N. J. Harrick, Harrick Scientific Corp. (United States)
J. L. Lauer, Rensselaer Polytechnic Institute (United States)
P. Vogel, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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