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Proceedings Paper

Triple Modulation FT-IR Spectrometry for Surface Analysis in the Far Infrared Region
Author(s): Norman A. Wright; Peter R. Griffiths
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Paper Abstract

Although several spectroscopic techniques yield analytical information about species adsorbed on flat surfaces, most of the more sensitive measurements require the sample to be placed in a high vacuum and/or only yield the elemental composition of the surface. Infrared spectrometry is not limited by either of the above constraints but does have the disadvantage of relatively poor sensitivity. Most previous measurements of the infrared spectra of adsorbed species on flat substrates have been above 700 cm-1 so that only the intramolecular vibrations of the adsorbate can be observed. Of equal importance, but very infrequently studied, are the intermolecular vibrational modes of the sorbed species and the metal substrate. Measurement of the frequency of these bands should yield direct information on the strength of the interaction between the adsorbate and the adsorbent.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970829
Show Author Affiliations
Norman A. Wright, University of California (United States)
Peter R. Griffiths, University of California (United States)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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