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Proceedings Paper

Accessories For Micro-Emission FTIR And Their Performance
Author(s): James L. Lauer; Peter Vogel
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Paper Abstract

Micro-emission FTIR (MEFTIR) is a most sensitive technique for the analysis of non-uniform surface layers. It is non-destructive, requires no sample preparation, can be used in an ambient environment, with flat or even rough surfaces, at high and low temperatures, and it requires only microscopic sample areas. In contrast to reflection methods, MEFTIR does not need precise angles of observation and its dynamic range requirement is small, since differencing is not involved. However, its sensitivity depends on wave-length by Planck's law.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970795
Show Author Affiliations
James L. Lauer, Rensselaer Polytechnic Institute (United States)
Peter Vogel, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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