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Proceedings Paper

Microsample Analysis Using An Infrared Microscope
Author(s): T. D. Dee; W. Herres; A . Simon; G . Zachman
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Paper Abstract

A microscope that can measure both in transmittance and reflectance with high sensitivity is described. Furthermore, the changeover is accomplished by moving only two handles and no realignment of the optics is necessary. Advantages of using this "dual-mode" microscope is discussed and several results are reported, highlighting some of its areas of application.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970784
Show Author Affiliations
T. D. Dee, Bruker Spectrospin (Canada) Ltd (Canada)
W. Herres, Bruker Ahalytische Messtechnik GMBH (Germany)
A . Simon, Bruker Ahalytische Messtechnik GMBH (Germany)
G . Zachman, Bruker Ahalytische Messtechnik GMBH (Germany)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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