Share Email Print

Proceedings Paper

Picogram Fourier transform-Infrared (FT-IR): Ultramicrosampling And Gas Chromatograph-Infrared (GC-IR)
Author(s): Tomas Hirschfeld
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The commonality between ultramicrosampling and GC-IR is far deeper than the desire for picogram detection levels in both cases. Both techniques also need small area light spots: in ultramicrosampling, for spatial resolution; and in GC-IR, to match limited sample volumes. Fast response is needed for real-time measurements on the fly GC-IR, and for mapping analysis of extended samples in a finite line in ultramicro-sampling. And finally, the fly fast processing is required for real-time recognition of significant success in GC-IR (presence of peaks) and in ultramicrosampling (presence of local anomalies in sample). A small FT-IR interferometer benefiting from the counter-Jacquinot advantage (and some less awkward nomenclature is clearly required here), immersion optics for microsampling and optimized sample cells for GC-IR, high efficiency sources and detectors (and detector electronics!), and the systematic application of information,theory to data processing algorithms can be used to bring both these techniques into the middle picogram domain. Progress from here will require cryogenic sampling GC-IR (giving only small improvements over an optimized light pipe) or non FT-IR techniques, such as grating (shudder!) scanned CO2 lasers (capable of a >100 fold gain).

Paper Details

Date Published: 20 December 1985
PDF: 4 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970765
Show Author Affiliations
Tomas Hirschfeld, Lawrence Livermore National Laboratory (United States)

Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

© SPIE. Terms of Use
Back to Top