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Proceedings Paper

Fourier Transform Infrared Ellipsometry Of Thin Polymer Films
Author(s): R . T. Graf; J. L. Koenig; H. Ishida
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Paper Abstract

Reflection spectra containing phase as well as intensity information were collected on a FT-IR spectrometer using two linear polarizers. The sample consisted of a poly(vinyl acetate) (PVAc) film on a copper substrate. Using well known principles of ellipsometry, the relative phase retardation (delta) and relative amplitude (psi) were calculated from these measurements.

Paper Details

Date Published: 20 December 1985
PDF: 2 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970736
Show Author Affiliations
R . T. Graf, Case Western Reserve University (United States)
J. L. Koenig, Case Western Reserve University (United States)
H. Ishida, Case Western Reserve University (United States)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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