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Proceedings Paper

Analytical Applications Of FT-IR
Author(s): D. E. Pivonka; R, C. Fry; W. G. Fateley
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Paper Abstract

Fourier Transform atomic emission spectroscopy is well suited to the determination of nonmetals in the red to near infrared region from 7,900 to 15,800 cm-1 (1) . The speed of Fourier Transform spectroscopy allows full spectrum monitoring of transient atomic emissions on a time scale as short as 0.5 s. The present report demonstrates new applications of this system for "on the fly" collection of nonmetal atomic emission spectra produced as gas chromatographic effluent is introduced into an atmospheric pressure helium microwave induced plasma (MIP). Simultaneous multi-element determination of C, H, N, 0, S, Si, P, F, Cl, Br, and I is now possible with the red to NIR Fourier transform atomic emission spectrometer.

Paper Details

Date Published: 20 December 1985
PDF: 3 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970732
Show Author Affiliations
D. E. Pivonka, Kansas State University (United States)
R, C. Fry, Kansas State University (United States)
W. G. Fateley, Kansas State University (United States)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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