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Proceedings Paper

Industrial Applications of Fourier Transform Infrared Spectroscopy
Author(s): A. Ishitani
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Paper Abstract

The latest advancement and potentiality of FT-IR as a tool for industrial materials characterization are reviewed. The position and advantages of FT-IR among other analytical techniques are also discussed, especially in surface and microanalyses. Several examples of FT-IR applications being done in TRC are presented. A study on bilayer membranes with embedded polypeptides, dispersed in water is shown as an example of bulk analysis. Surface analysis of an oxide layer on a silicon wafer by ATR using the wafer itself as an IRE plate is explained. Potentiality of PAS for a deep sampling probe on multilayered composition is illustrated. Finally the present stage of FT-IR microanalysis using an infrared microscope is discussed using examples on real samples.

Paper Details

Date Published: 20 December 1985
PDF: 9 pages
Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970712
Show Author Affiliations
A. Ishitani, Toray Research Center, Inc. (Japan)


Published in SPIE Proceedings Vol. 0553:
Fourier and Computerized Infrared Spectroscopy
David G. Cameron; Jeannette G. Grasselli, Editor(s)

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