Share Email Print
cover

Proceedings Paper

The computer-aided alignment study of three-mirror off-axis field bias optical system
Author(s): Zhihai Pang; Xue-wu Fan; Zhen Ma; Qinfang Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Determine the misalignment of optical element quickly and exactly is the key to the technology of computer-aided alignment (CAA). For alignment a three-mirror off-axis field bias system, the sensitivity matrix method was used to simulate the alignment process. The results of simulation show that the sensitivity matrix method was not convergence. A new CAA method to get misalignment was put forward; the misalignment was obtained by programming the function of optical design software CODE V’s auto-optimization option. The system’s alignment characteristic was analysis and made use of this new method put up a computer simulation. The results of simulation show that the misalignment determined by only once auto-optimization and guidable to alignment of this system. After alignment, the optical system produced a measured wave front error across the all image plane less than 0.08 waves RMS at λ=0.6328μm.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170L (15 October 2012); doi: 10.1117/12.970651
Show Author Affiliations
Zhihai Pang, Xi’an Institute of Optics and Precision Mechanics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Xue-wu Fan, Xi'an Institute of Optics and Precision Mechanics (China)
Zhen Ma, Xi'an Institute of Optics and Precision Mechanics (China)
Qinfang Chen, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top