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Proceedings Paper

Applying infrared thermal wave technology to study the bonding structure defects of steel shell/insulation
Author(s): Wei Zhang; Wenyuan Luo; Cuiqin Wu; Yuanjia Song; Guofeng Jin; Qike Li; Lu Tian
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Paper Abstract

Infrared thermal wave technology has gained widely adopted as a nondestructive method in many fields, especially in the aerospace, manufacturing industries, etc. In this paper, pulsed thermography method was used to detect a structure with big curvature. The structure, in which there are five pre-designed debonding defects, is steel shell / insulation bonding structure. However, the characteristics of large curvature and complex surface will lead to uneven heat loading and serious non-uniformity of the thermograms. In order to solve the problem, oblique segment detection method was used. Watershed method was adopted to process the acquired thermograms for noise reduction, enhancement and segmentation. Eventually, the size of the defect has been identified. Through the experiment we concluded that, in the same depth, a larger defect is more easily to be identified, and the recognition accuracy is higher; Compared with conventional nondestructive testing methods, infrared thermal wave nondestructive testing is a better curvature tolerant method; For thin specimens, small defects can be well identified; When curvature specimen is in parallel with the pulsed flash tube, there would be a serious reflection phenomenon on the surface. By using the method of surface treatment and oblique segment detection, the results have been greatly improved.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84181O (15 October 2012); doi: 10.1117/12.970612
Show Author Affiliations
Wei Zhang, Xi'an Research Institute of High Technology (China)
Wenyuan Luo, Xi'an Research Institute of High Technology (China)
Cuiqin Wu, Xi'an Research Institute of High Technology (China)
Yuanjia Song, Xi'an Research Institute of High Technology (China)
Guofeng Jin, Xi'an Research Institute of High Technology (China)
Qike Li, Xi'an Research Institute of High Technology (China)
Lu Tian, Xi'an Research Institute of High Technology (China)


Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Song Hu; Yanqiu Li; Xiangang Luo; Xiaoyi Bao, Editor(s)

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