Share Email Print
cover

Proceedings Paper

Focal length and focal depth of metallic superlens
Author(s): Pengfei Cao; Lin Cheng; Ying Li; Xiaoping Zhang; Weijie Kong; Li Gong; Xining Zhao
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We consider the problems of focal length and focal depth of subwavelength imaging via a silver slab of metallic superlens. The performance limit of the metallic superlens was associated with the losses in the metallic film. The transmittance through a metal film is quite low and decreases exponentially with the thickness of the metal film. In the visible wavelength region, the permittivity of Ag can be approximated by the Drude model, so it can be described as the plural permittivity. The real part ( Ε′ ) of permittivity of the metal slab has been preferably index matched to the host material, and the imaginary part ( Ε″ ) is considered to prevent ideal reconstruction of the image. Because superlens are usually made of metals with significant intrinsic loss ( Ε″>0 ), the image is blurred and it is regarded as an ultimate limitation to a near field perfect lens. The real part ( Ε′ )and the imaginary part ( Ε″ ) of permittivity of the metal slab is the function of the incident wavelength, so we discuss the relationship of the focal length, focal depth and the incident wavelength. We also derive the expression for the resolution limit of metallic lens and demonstrate that the area of its subwavelength performance is usually limited to the near-field zone.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 841803 (15 October 2012); doi: 10.1117/12.970609
Show Author Affiliations
Pengfei Cao, Lanzhou Univ. (China)
State Key Lab. of Transient Optics and Photonics (China)
Lin Cheng, Lanzhou Univ. (China)
Ying Li, Lanzhou Univ. (China)
Xiaoping Zhang, Lanzhou Univ. (China)
Weijie Kong, Lanzhou Univ. (China)
Li Gong, Lanzhou Univ. (China)
Xining Zhao, Lanzhou Univ. (China)
State Key Lab. of Transient Optics and Photonics (China)


Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Song Hu; Yanqiu Li; Xiangang Luo; Xiaoyi Bao, Editor(s)

© SPIE. Terms of Use
Back to Top