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Proceedings Paper

Remote sensing image stitch using modified structure deformation
Author(s): Ke-cheng Pan; Jin-wei Chen; Yueting Chen; Huajun Feng
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Paper Abstract

To stitch remote sensing images seamlessly without producing visual artifact which is caused by severe intensity discrepancy and structure misalignment, we modify the original structure deformation based stitching algorithm which have two main problems: Firstly, using Poisson equation to propagate deformation vectors leads to the change of the topological relationship between the key points and their surrounding pixels, which may bring in wrong image characteristics. Secondly, the diffusion area of the sparse matrix is too limited to rectify the global intensity discrepancy. To solve the first problem, we adopt Spring-Mass model and bring in external force to keep the topological relationship between key points and their surrounding pixels. We also apply tensor voting algorithm to achieve the global intensity corresponding curve of the two images to solve the second problem. Both simulated and experimental results show that our algorithm is faster and can reach better result than the original algorithm.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200S (15 October 2012); doi: 10.1117/12.970608
Show Author Affiliations
Ke-cheng Pan, Zhejiang Univ. (China)
Jin-wei Chen, Zhejiang Univ. (China)
Yueting Chen, Zhejiang Univ. (China)
Huajun Feng, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 8420:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
Xiangdi Lin; Yoshiharu Namba; Tingwen Xing, Editor(s)

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