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Proceedings Paper

Millimeter Wave Ellipsometer
Author(s): Thomas L. Thorpe; Frank S. Barnes; Donald S. Gage
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Paper Abstract

This paper studies the design of a proposed compensator-less ellipsometer in the 93 GHz microwave region. The ellipsometer will be used to make contactless measurements of the complex dielectric constant of thin film solar cell semiconductors below the plasma frequency of the films.

Paper Details

Date Published:
PDF: 8 pages
Proc. SPIE 0248, Role of Electro-Optics in Photovoltaic Energy Conversion, ; doi: 10.1117/12.970601
Show Author Affiliations
Thomas L. Thorpe, University of Colorado (United States)
Frank S. Barnes, University of Colorado (United States)
Donald S. Gage, University of Colorado (United States)


Published in SPIE Proceedings Vol. 0248:
Role of Electro-Optics in Photovoltaic Energy Conversion
Satyendra K. Deb, Editor(s)

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