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Proceedings Paper

Millimeter Wave Fabry-Perot Interferometer For The Measurement Of The Conductivity Of Thin Films For Solar Cells
Author(s): Donald S. Gage; Leonard Lewin; Frank S. Barnes
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Paper Abstract

The conductivity of a thin film on a metal plate can be calculated from measurements of the Q of the cavity of a Fabry-Perot interferometer and the thin film if the cavity without the film has been previously measured. The theory for the conductivity which shows a cubic dependence on the thickness of the film has been developed. The measurement system at 93 gigahertz is described. Experimental results are presented.

Paper Details

Date Published: 25 November 1980
PDF: 10 pages
Proc. SPIE 0248, Role of Electro-Optics in Photovoltaic Energy Conversion, (25 November 1980); doi: 10.1117/12.970600
Show Author Affiliations
Donald S. Gage, University of Colorado (United States)
Leonard Lewin, University of Colorado (United States)
Frank S. Barnes, University of Colorado (United States)


Published in SPIE Proceedings Vol. 0248:
Role of Electro-Optics in Photovoltaic Energy Conversion
Satyendra K. Deb, Editor(s)

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