Proceedings Paper
Error analysis of Gaussian spot width measured with CCD sensor| Format | Member Price | Non-Member Price |
|---|---|---|
| $14.40 | $18.00 |
Paper Abstract
The system errors and random errors of a CCD sensor cause measurement errors of a laser spot width. Taking the
Gaussian spot as example, the computer simulation method is used to analyze the influences of the measurement window
size, the non-ideal integral sampling, the number of quantization lever and the read-out noise on the measurement
precision of Gaussian spot width respectively, and the synthesized influences of these four kinds of error sources of the
laboratory 8-bit CCD sensor on the measurement precision of Gaussian spot width. An optimal measurement window
size is given. Simulation results are analyzed and discussed.
Paper Details
Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841720 (15 October 2012); doi: 10.1117/12.970553
Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841720 (15 October 2012); doi: 10.1117/12.970553
Show Author Affiliations
Yuanxing He, Institute of Optics and Electronics (China)
National Univ. of Defense Technology (China)
National Univ. of Defense Technology (China)
Xinyang Li, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)
© SPIE. Terms of Use
