Share Email Print
cover

Proceedings Paper

Error analysis of Gaussian spot width measured with CCD sensor
Author(s): Yuanxing He; Xinyang Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The system errors and random errors of a CCD sensor cause measurement errors of a laser spot width. Taking the Gaussian spot as example, the computer simulation method is used to analyze the influences of the measurement window size, the non-ideal integral sampling, the number of quantization lever and the read-out noise on the measurement precision of Gaussian spot width respectively, and the synthesized influences of these four kinds of error sources of the laboratory 8-bit CCD sensor on the measurement precision of Gaussian spot width. An optimal measurement window size is given. Simulation results are analyzed and discussed.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841720 (15 October 2012); doi: 10.1117/12.970553
Show Author Affiliations
Yuanxing He, Institute of Optics and Electronics (China)
National Univ. of Defense Technology (China)
Xinyang Li, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top