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Proceedings Paper

Wavefront error sensing based on phase diversity technology and image restoration
Author(s): Qiang Cheng; Fazhi Li; Xiaoping Tao; Feng Yan; Xuejun Zhang
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Paper Abstract

Phase Diversity (PD) is a kind of wavefront sensing technology based on image collecting and restoration. Two images are collected with different defocus values, and the Zernike coefficients of the system wavefront can be solved. This paper focuses on the algorithm of PD technology and image restoration. Several kinds of wavefront aberration and different defocus distance are also introduced to verify the robustness of the algorithm. Results show that the maximum wavefront aberration introduced is 1.5851λ (RMS) when the residual error of calculation required is less than λ/50 (RMS), and the residual error reaches minimum when the Zernike coefficient variation induced by defocus is 1λ. Also, the Structural Similarity (SSIM) is selected to evaluate the quality of restored images.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170R (15 October 2012); doi: 10.1117/12.970394
Show Author Affiliations
Qiang Cheng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Fazhi Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xiaoping Tao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Feng Yan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xuejun Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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