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Proceedings Paper

Development of two-framing camera with large format and ultrahigh speed
Author(s): Xiaoguo Jiang; Yuan Wang; Yi Wang
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Paper Abstract

High-speed imaging facility is important and necessary for the formation of time-resolved measurement system with multi-framing capability. The framing camera which satisfies the demands of both high speed and large format needs to be specially developed in the ultrahigh speed research field. A two-framing camera system with high sensitivity and time-resolution has been developed and used for the diagnosis of electron beam parameters of Dragon-I linear induction accelerator (LIA). The camera system, which adopts the principle of light beam splitting in the image space behind the lens with long focus length, mainly consists of lens-coupled gated image intensifier, CCD camera and high-speed shutter trigger device based on the programmable integrated circuit. The fastest gating time is about 3 ns, and the interval time between the two frames can be adjusted discretely at the step of 0.5 ns. Both the gating time and the interval time can be tuned to the maximum value of about 1 s independently. Two images with the size of 1024×1024 for each can be captured simultaneously in our developed camera. Besides, this camera system possesses a good linearity, uniform spatial response and an equivalent background illumination as low as 5 electrons/pix/sec, which fully meets the measurement requirements of Dragon-I LIA.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170M (15 October 2012); doi: 10.1117/12.970286
Show Author Affiliations
Xiaoguo Jiang, Institute of Fluid Physics (China)
Yuan Wang, Institute of Fluid Physics (China)
Yi Wang, Institute of Fluid Physics (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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