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Proceedings Paper

Stability Of Thin Te And Te-Alloy Films For Optical Data Storage
Author(s): Wen-yaung Lee; M. Chen; H. Wieder; V. Marrello
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Paper Abstract

The stability of Te and Te-alloy films for optical data storage was studied both over a large area by using a uniformly illuminated light source and locally by using a scanning laser beam. These films are found to degrade uniformly, with limited localized degradation. The dominant degradation mechanism of thin Te films is the uniform oxidation of Te to an optically non-absorbing TeO2. Localized degradation occurs only at regions where initial defects on the film or when conditions leading to water condensation on the surface of the film are present. Promising Te-based optical recording media with both excellent archival stability and reasonable laser writing characteristics have been developed from this study.

Paper Details

Date Published: 1 January 1983
PDF: 8 pages
Proc. SPIE 0382, Optical Data Storage, (1 January 1983); doi: 10.1117/12.970216
Show Author Affiliations
Wen-yaung Lee, IBM Research Laboratory (United States)
M. Chen, IBM Research Laboratory (United States)
H. Wieder, IBM Research Laboratory (United States)
V. Marrello, IBM Research Laboratory (United States)


Published in SPIE Proceedings Vol. 0382:
Optical Data Storage
Di Chen, Editor(s)

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