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Proceedings Paper

Dynamic Testing Of Optical Disk Profile
Author(s): Julian Lewkowicz; Don Cohen
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Paper Abstract

It is shown that focus error signal spectrum, measured while disk is spinning, represents Fourier transform of the disk profile modified by the loop gain.

Paper Details

Date Published: 1 January 1983
PDF: 4 pages
Proc. SPIE 0382, Optical Data Storage, (1 January 1983); doi: 10.1117/12.970208
Show Author Affiliations
Julian Lewkowicz, IBM Corporation (United States)
Don Cohen, IBM Corporation (United States)

Published in SPIE Proceedings Vol. 0382:
Optical Data Storage
Di Chen, Editor(s)

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