Share Email Print

Proceedings Paper

The Use of Linear Arrays in Electronic Speckle Pattern Interferometry
Author(s): Michael Short
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Electronic Speckle Pattern Interferometry (ESPI) offers high resolution displacement information of objects by analysis of the relative phase between a reference beam of light and an object beam of light at two or more instants in time. The sampling of the data is usually performed with two-dimensional solid-state arrays. Use of a one-dimensional array, however, offers increased displacement resolution or larger field of view, depending upon the optical setup, and offers higher line rates over two-dimensional cameras. The disadvantages imposed by the one-dimensional vs two-dimensional sampling, including object motion restrictions and automatic fringe extraction are discussed.

Paper Details

Date Published: 1 April 1990
PDF: 7 pages
Proc. SPIE 1194, Optics, Illumination, and Image Sensing for Machine Vision IV, (1 April 1990); doi: 10.1117/12.969855
Show Author Affiliations
Michael Short, Digital Design, Inc (United States)

Published in SPIE Proceedings Vol. 1194:
Optics, Illumination, and Image Sensing for Machine Vision IV
Donald J. Svetkoff, Editor(s)

© SPIE. Terms of Use
Back to Top