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Proceedings Paper

3-D Gradient and Curvature Measurement Using Local Image Information
Author(s): Harry S. Gallarda; Leonard H. Bieman; Kevin G. Harding
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Paper Abstract

This paper describes an image processing method that measures 3-D gradient and curvature information directly from local surface information using structured moire light. The method relies on the use of a sinusoidal grating to produce the moire patterns. It is shown that the gradient can be estimated by ratioing the third and first spatial derivative of the gray-scale image, but this simple solution does not work well in practice. We derive an alternate solution that uses finite differences and computes a Least Square Estimate of the ratio for small regions of the surface. We describe the results of this method implemented on a PC-based image processing system. Initial results indicate that the method worked well, could be applied to many simple 3-D problems, and implemented on an inexpensive computer system.

Paper Details

Date Published: 1 April 1990
PDF: 11 pages
Proc. SPIE 1194, Optics, Illumination, and Image Sensing for Machine Vision IV, (1 April 1990); doi: 10.1117/12.969852
Show Author Affiliations
Harry S. Gallarda, Industrial Technology Institute (United States)
Leonard H. Bieman, Industrial Technology Institute (United States)
Kevin G. Harding, Industrial Technology Institute (United States)

Published in SPIE Proceedings Vol. 1194:
Optics, Illumination, and Image Sensing for Machine Vision IV
Donald J. Svetkoff, Editor(s)

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