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Proceedings Paper

Design And Testing Of A Microscopic Reflectometer
Author(s): Jay McClellan; Norman Wittels; Allison Gotkin; Cathy Hepp; Patrick King
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Paper Abstract

A reflectometer was designed to measure reflectivities of sample areas ranging from 10 microns to 1 millimeter. It is capable of illuminating the sample from any angle between 0 and 45 degrees relative to the surface normal, with the observation angle always normal to the surface. The instrument was calibrated and tested using reflectivity standards. Plots of reflectivity versus illumination angle are presented for some common materials.

Paper Details

Date Published: 1 April 1990
PDF: 9 pages
Proc. SPIE 1194, Optics, Illumination, and Image Sensing for Machine Vision IV, (1 April 1990); doi: 10.1117/12.969845
Show Author Affiliations
Jay McClellan, Allen-Bradley (United States)
Norman Wittels, Worcester Polytechnic Institute (United States)
Allison Gotkin, Worcester Polytechnic Institute (United States)
Cathy Hepp, Worcester Polytechnic Institute (United States)
Patrick King, Worcester Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 1194:
Optics, Illumination, and Image Sensing for Machine Vision IV
Donald J. Svetkoff, Editor(s)

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