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Proceedings Paper

FT IR-Spectroscopy And Quartz Surface Polariton Splitting By Ion-Implanted Layer
Author(s): G. N Zhizhin; K. T. Antonova
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Paper Abstract

Me optical properties of ion implanted (200 KeV, N+ions, doses 8x10 13-3x10 16 ion. cm-2) and thermal annealed (700C) quartz are investigated using a Fourier-transform spectrometer BOMEM MICHELSON 110. A dispersion analysis and surface polariton-spectroscopy were used to determine the optical constants of the damaged transition surface layer. The influence of dose is studied and a comparison is made with the properties of the samples before annealing.

Paper Details

Date Published: 1 December 1989
PDF: 2 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969619
Show Author Affiliations
G. N Zhizhin, Acad. Sc i. USSR (USSR)
K. T. Antonova, Institute of Solid State Physics (Bulgaria)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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