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Proceedings Paper

Design Considerations For Fourier Transform Spectrometry In The Near-Infrared And Visible Regions
Author(s): Matthew J. Smith; Robert J. Rosenthal
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Paper Abstract

Recent advances in the design of Fourier transform spectrometers have now made it possible to extend the spectral range of a single instrument from less than 50 cm-1 to greater than 30,000 cm-1. The most innovative of these instruments allow the sources, beamsplitters and detectors to be changed, and the instrument to be automatically realigned, all within a matter of seconds. As a result, it is possible to measure the electronic and vibrational absorption spectra of samples with the same instrument. In addition, with recent advances in the technique of FT-Raman spectroscopy using near-infrared and visible lasers, it is now possible to measure high resolution Raman spectra with the same interferometer as well. Thus, one Fourier transform instrument can serve to solve many molecular spectroscopy problems. However, extending the range of the interferometer to the shorter wavelengths of the near-infrared, visible and ultraviolet regions places critical demands on the quality of the optical system. To obtain a spectrum at high resolution at high energy, the interferometer moving mirror must travel absolutely perpendicular to the plane of the incident radiation. Any tilt in the moving mirror will degrade the optical resolution, with increasing severity at higher energies. In this presentation, some of the critical aspects of high resolution interferometry at short wavelengths will be discussed. The use of an ultra-stable Fourier transform spectrometer employing a dynamic tilt compensation mechanism will be shown for the measurement of spectra in the near-infrared and visible.

Paper Details

Date Published: 1 December 1989
PDF: 1 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969502
Show Author Affiliations
Matthew J. Smith, Nicolet Instrument Corporation (United States)
Robert J. Rosenthal, Nicolet Instrument Corporation (United States)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy

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