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Proceedings Paper

FT-IR Emission Spectroscopy As A Tool For Studying Thin Films And Thermal Changes In Samples
Author(s): Senja V. Compton; Jay R. Powell; David A.C. Compton
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Paper Abstract

Infrared emission spectroscopy has been used routinely to study samples at high temperatures, such as rocket plumes. The designs of modern FT-IR instruments and a new emission accessory having high optical throughput, now allow the observation of emission spectra at much lower temperatures than previously. This greatly enhanced sensitivity to emission energy can be used routinely to either record spectra at room temperature, or obtain information about very thin films.

Paper Details

Date Published: 1 December 1989
PDF: 3 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969462
Show Author Affiliations
Senja V. Compton, Bio-Rad Labbratories (United States)
Jay R. Powell, Bio-Rad Laboratories (United States)
David A.C. Compton, Bio-Rad Labbratories (United States)


Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy

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