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Proceedings Paper

Micro-FTIR As A Stress Probe For Ceramic Materials
Author(s): James W. Rydzak; W. Roger Cannon; Maarit Hanninen
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Paper Abstract

A method to measure stress in ceramics has been developed using an FTIR equipped with an infrared microscope. The method, developed with sapphire a a model ceramic materfal, involves calibration of small shifts in the 630 cm -1 band. A differential technique using spectral subtraction was developed to accurately measure the shifts (0.1-0.4 cm'). A four point bending apparatus was built to induce variable stresses in the surface of the sapphire. Ttle amount of stress has been correlated with the measured shift in the 630 cm 11absorbance band. The technique has been automated using a computer controlled mapping stage. Stresses near a crack in a sapphire sample have been profiled. This non-destructive technique has applications as a tool to help understand and improve mechanical properties of polycrystalline ceramics, composites, and optical fibers.

Paper Details

Date Published: 1 December 1989
PDF: 11 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969430
Show Author Affiliations
James W. Rydzak, Rutgers University (United States)
W. Roger Cannon, Rutgers University (United States)
Maarit Hanninen, Rutgers University (United States)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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