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Proceedings Paper

Fourier Transform Raman Spectroscopy In The Near Infrared - Industrial Applications And Limitations
Author(s): H. F. Shurvell; F. J. Bergin
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Paper Abstract

In the past the application of Raman spectroscopy as an analytical tool has been severely restricted by laser induced fluorescence. It has been demonstrated recently 1,2, that near infrared Fourier Transform Raman spectroscopy can offer a solution to this problem. Near infrared laser excitation energy is, in general, too low to excite fluorescence. Unfortunately, the scattered Raman intensity is inversely proportional to the fourth power of the wavelength. This leads to a reduction in intensity of a factor of 22 on moving from 514.5 nm to 1064.1 nm excitation. Also, near infrared detectors are orders of magnitude less sensitive than photomultipliers used in conventional Raman spectroscopy. Despite these restrictions the FT-Raman technique opens up new possibilities for Raman spectroscopy.

Paper Details

Date Published: 1 December 1989
PDF: 2 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969419
Show Author Affiliations
H. F. Shurvell, Queen's University (Canada)
F. J. Bergin, Thornton Research Centre (U.K.)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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