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Proceedings Paper

Optimization Of The Sample Technique For NIR FT Raman Spectroscopy
Author(s): Bernhard Schrader; Andreas Hoffmann; Martin Tischer; Rolf Podschadlowski; Arno Simon
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Paper Abstract

Raman spectroscopy is a powerful complement to infrared spectroscopy due to experimental as well as theoretical aspects: However, 'classical' Raman spectroscopy is not commonly used. This is mainly due to the fact that the fluorescence of minute amounts of impurities, excited by the radiation in the UV or visible range can mask the Raman spectra completely. NIR FT Raman spectrometers' have several advantages. As exciting light usually the radiation of the Nd-doped YAG laser at a wavelength of 1064 nm is used. Problems with fluorescing samples are largely reduced. There is the 'throughput advantage' of the Michelson interferometer and its high wavenumber accuracy. However, the intensity of the Raman radiation is inversely proportional to the fourth power of its absolute frequency. Laser light fluxes larger by the ν4-factor of about 30 are necessary to achieve the same radiance of the Raman lines in the NIR compared to the visible region. This enhances the danger of pyrolysis of the sample. In order to reduce this danger the whole instrument should have the largest possible optical conductance. Interferometers are therefore appropriate when they are properly matched to a sample arrangement with maximal efficiency.

Paper Details

Date Published: 1 December 1989
PDF: 2 pages
Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969418
Show Author Affiliations
Bernhard Schrader, Universitat Essen (Germany)
Andreas Hoffmann, Universitat Essen (Germany)
Martin Tischer, Universitat Essen (Germany)
Rolf Podschadlowski, Universitat Essen (Germany)
Arno Simon, Bruker Analytische MeBtechnik GmbH (Germany)

Published in SPIE Proceedings Vol. 1145:
7th Intl Conf on Fourier Transform Spectroscopy
David G. Cameron, Editor(s)

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