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Proceedings Paper

Versatile Printed Wiring Board Pattern Inspection Algorithm: Radial Matching
Author(s): Satoshi Iwata; Moritoshi Ando; Takefumi Inagaki
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Paper Abstract

We have developed versatile pattern inspection algorithm that we call Radial Matching, which generates pattern code. dictionaries and enables many different patterns to be inspected by changing dictionary contents. The system inspects all defect type analyzing pattern attributes and connections without referencing layout artwork. It measures a copper pattern radially in eight directions. Sensors are 22.5 degrees apart. Length and orientation data are converted 16-bit codes that can express all printed wiring board (1)V1B) patterns, containing ordinal patterns and defects. Dictionaries are generated when 'PWB patterns are inspected and good and defective codes are classified., These features enable a code dictionary to be generated using only the first PWB. Experiments show that original pat terns can be described using 27% of the codes. Code classification for inspection can be done on a 100 mm2 area. The new algorithm has been implemented a system in use at a Fujitsu plant.

Paper Details

Date Published: 21 March 1989
PDF: 9 pages
Proc. SPIE 1095, Applications of Artificial Intelligence VII, (21 March 1989); doi: 10.1117/12.969363
Show Author Affiliations
Satoshi Iwata, Fujitsu Laboratories Ltd. (Japan)
Moritoshi Ando, Fujitsu Laboratories Ltd. (Japan)
Takefumi Inagaki, Fujitsu Laboratories Ltd. (Japan)


Published in SPIE Proceedings Vol. 1095:
Applications of Artificial Intelligence VII
Mohan M. Trivedi, Editor(s)

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