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Proceedings Paper

Honeyshell: A Flexible Expert System For Defect And Cause Analysis For Wave Soldering
Author(s): Rajsbekhar D. Oza; Pravir Malik
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Paper Abstract

An expert system for diagnosis of defect and analysis of cause in manufacturing an integrated circuit board (IC board) has been designed and built. The system architecture supports emulation of two important aspects of expert's problem solving. The first aspect concerns expert's ability to diagnose the defect quickly after a cursory examination of the IC Board. The second aspect concerns expert's ability to refocus his attention on likely defect candidates quickly if his initial considerations fail. Our approach uses rule classification and system architecture to accomplish this. The additional benefits are faster response time, dramatic reduction in the size of the rule base and the ability for the user to select level of expertise in this expert system to match his own level.

Paper Details

Date Published: 21 March 1989
PDF: 9 pages
Proc. SPIE 1095, Applications of Artificial Intelligence VII, (21 March 1989); doi: 10.1117/12.969338
Show Author Affiliations
Rajsbekhar D. Oza, University of Florida (United States)
Pravir Malik, University of Florida (United States)


Published in SPIE Proceedings Vol. 1095:
Applications of Artificial Intelligence VII
Mohan M. Trivedi, Editor(s)

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