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Proceedings Paper

Measurements Of Dynamic Behavior Of Materials By Laser Dopplervelocitymeter
Author(s): Tian Qingzheng; Zou Wenhao; Yuan Guifang; Zheng Bo; Wu Cheng; Xiong Yingming
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Paper Abstract

The multi-wave structure of the stress wave in an explosively loaded plate and the front width of stress wave profile are diagnosed with F-PVIS (Fabry-Perot Velocity Interfero-meter System) and ORVIS (Optically Recording Velocity Interferometer System). Under various explosive loading strengths, material free surface velocities of various thickness plate Ufs are measured. High resolution records obtained from this laser Dopple velocitymeter clearly show the velocities and amplitudes of elastic, first plastic (phase transition), and second plastic wave etc. Hugoniot elastic limit, phase transition point, and various loading strenth points are measured and the P-v Hugoniot are drawn in low pressure range. The leading shock and trailing rarefaction interact with the front free surface. The shock wave reflects from the free surface as a rarefaction wave propagating backward. When two opposing rarefaction waves collide, material on either sides of the interaction plane will be accelerated in opposite directions. This will result in tensile stress. If this tensile stress is great enough, incipient spallation will begin to occur at the interaction plane. Shock wave which is generated by spallation will propagate toward and reflect at the front free surface, and its reflection wave will propagate and reflect between two free surfaces repeatedly. That will cause the oscillation of the Ufs(t) curve. The amplitude Ufs is called pullback and can be used to compute the spall stfength. Some typical measurement results by using F-PVIS and ORVIS are discussed as well as the resolution of instruments.

Paper Details

Date Published: 7 June 1989
PDF: 1 pages
Proc. SPIE 1032, 18th Intl Congress on High Speed Photography and Photonics, (7 June 1989); doi: 10.1117/12.969191
Show Author Affiliations
Tian Qingzheng, Xian Modern Chemistry Research Institute (China)
Zou Wenhao, Xian Modern Chemistry Research Institute (China)
Yuan Guifang, Xian Modern Chemistry Research Institute (China)
Zheng Bo, Xian Modern Chemistry Research Institute (China)
Wu Cheng, Xian Modern Chemistry Research Institute (China)
Xiong Yingming, Xian Modern Chemistry Research Institute (China)


Published in SPIE Proceedings Vol. 1032:
18th Intl Congress on High Speed Photography and Photonics
DaHeng Wang, Editor(s)

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