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Proceedings Paper

A Set Of Instruments For Measuring Parameters Of Single Subnano- And Picosecond Signals
Author(s): Yu. A. Golovastikov; Yu. V. Speranskii
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Paper Abstract

Present-day experimental physics and laser technology set forth increasingly high requirements to fast process parameters measuring means. Some 10 or 15 years ago, investigations were focused on processes of a nanose-cond duration (10-9 s), whereas today research demand measurements in pico (10-12) and femtosecond (10-15s) time ranges.

Paper Details

Date Published: 7 June 1989
PDF: 3 pages
Proc. SPIE 1032, 18th Intl Congress on High Speed Photography and Photonics, (7 June 1989); doi: 10.1117/12.969173
Show Author Affiliations
Yu. A. Golovastikov, All-Union Research Institute for Optical and Physical Measurements (USSR)
Yu. V. Speranskii, All-Union Research Institute for Optical and Physical Measurements (USSR)


Published in SPIE Proceedings Vol. 1032:
18th Intl Congress on High Speed Photography and Photonics
DaHeng Wang, Editor(s)

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