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Proceedings Paper

Ultrafast Optical Waveform Characterization New Trend Of Ultrafast Streak Camera Technology
Author(s): Yutaka Tsuchiya; Musubu Koishi
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Paper Abstract

Waveform measurement of ultrafast optical signals is discussed as a promising application field of the streak camera technology. The key techniques for such measurement are elliptical scan and electron sampling. The optical oscilloscopes, which we have recently developed to perform the measurement mentioned above, are discussed on its operation and results of practical measurement. The results have showed excellent performances such as the time resolution of = 10 ps, the wide dynamic range of > 1:10 3, and distortionless, which features are far exceeding the limits of measurement by ordinary technique.

Paper Details

Date Published: 7 June 1989
PDF: 9 pages
Proc. SPIE 1032, 18th Intl Congress on High Speed Photography and Photonics, (7 June 1989); doi: 10.1117/12.969146
Show Author Affiliations
Yutaka Tsuchiya, Hamamatsu Photonics K.K. (Japan)
Musubu Koishi, Hamamatsu Photonics K.K. (Japan)

Published in SPIE Proceedings Vol. 1032:
18th Intl Congress on High Speed Photography and Photonics
DaHeng Wang, Editor(s)

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