Share Email Print

Proceedings Paper

Developments In Electronic Speckle Pattern Interferometry For Automotive Vibration Analysis.
Author(s): Jeremy C. Davies; Clive H. Buckberry; Julian D. C. Jones; Chris N. Pannell
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The incorporation of monomode fibre optics into an argon ion powered Electronic Speckle Pattern Interferometer (ESPI) is reported. The system, consisting of an optics assembly linked to the laser and a CCD camera transceiver, flexibly connected by 40m of monomode fibre optic cable to the optics, has been used to analyse the modal behaviour of structures up to 5m X 3m X 2m in size. Phase modulation of the reference beam in order to operate in a heterodyne mode has been implemented using a piezo-electric crystal operating on the monomode fibre. A new mode of operation - sequential time-average subtraction - and the results of a new processing algorithm are also reported. Their implementation enables speckle free, time-average vibration maps to be generated in real-time on large, unstable structures. Example results for a four cylinder power unit, a vehicle body shell component and an engine oil pan are included. In all cases the analysis was conducted in a general workshop environment without the need for vibration isolation facilities.

Paper Details

Date Published: 16 January 1988
Proc. SPIE 0952, Laser Technologies in Industry, (16 January 1988); doi: 10.1117/12.968842
Show Author Affiliations
Jeremy C. Davies, Austin Rover Group Limited (United Kingdom)
Clive H. Buckberry, Austin Rover Group Limited (United Kingdom)
Julian D. C. Jones, University of Kent at Canterbury (United Kingdom)
Chris N. Pannell, University of Kent at Canterbury (United Kingdom)

Published in SPIE Proceedings Vol. 0952:
Laser Technologies in Industry
Silverio P. Almeida; Luis Miguel Bernardo; Oliverio D.D. Soares, Editor(s)

© SPIE. Terms of Use
Back to Top