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Proceedings Paper

Some New Techniques With Digital Speckle Pattern Interferometry (DSPI)
Author(s): R. S. Sirohi; A. R. Ganesan; M. P. Kothiyal
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Paper Abstract

Digital Speckle Pattern Interferometry (DSPI) is presented as a real-time technique for a number of applications such as measurement of small displacements, displacement derivatives, contouring, and non-destructive testing. The implementation of DSPI on a commercially available image processing system is described. A method of fringe sharpening in DSPI is also presented.

Paper Details

Date Published: 16 January 1988
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Proc. SPIE 0952, Laser Technologies in Industry, (16 January 1988); doi: 10.1117/12.968836
Show Author Affiliations
R. S. Sirohi, Indian Institute of Technology (India)
A. R. Ganesan, Indian Institute of Technology (India)
M. P. Kothiyal, Indian Institute of Technology (India)


Published in SPIE Proceedings Vol. 0952:
Laser Technologies in Industry

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