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Proceedings Paper

Overview Of Optical Methods In Metrology
Author(s): Jean Ebbeni
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Paper Abstract

The aim of this paper is not to give a long and tedious description of all the optical methods used in metrology, but to draw some general specific propertters and ideas illustrated by representative applications. Impact of non-linear optics, optical waveguides and holographic optical elements are selected fields for this review.

Paper Details

Date Published: 16 January 1988
Proc. SPIE 0952, Laser Technologies in Industry, (16 January 1988); doi: 10.1117/12.968814
Show Author Affiliations
Jean Ebbeni, Universite Libre de Bruxelles (Belgium)

Published in SPIE Proceedings Vol. 0952:
Laser Technologies in Industry
Silverio P. Almeida; Luis Miguel Bernardo; Oliverio D.D. Soares, Editor(s)

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