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Experimental qualification and validation of fibre optic strain sensorsFormat | Member Price | Non-Member Price |
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Paper Abstract
Strain sensors used in practical applications must provide reliable measurement data. To achieve this, sensor systems
must be validated by using experimental facilities that enable physically independent statements about the performance
of the sensor components. The paper describes qualification and validation procedures using a special facility to qualify
surface-applied strain sensors and to achieve reliable sensor results. Based on examples concerning fibre optic strain
sensor patches with and without FBG sensors, the determination of the strain gauge factor also under combined thermal
and mechanical loading will be presented. These results are the basis for development of guidelines and standards.
Paper Details
Date Published: 7 November 2012
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 8421AT (7 November 2012); doi: 10.1117/12.968801
Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)
PDF: 4 pages
Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 8421AT (7 November 2012); doi: 10.1117/12.968801
Show Author Affiliations
Constanze Schilder, BAM Federal Institute for Materials Research and Testing (Germany)
Nadine Kusche, BAM Federal Institute for Materials Research and Testing (Germany)
Nadine Kusche, BAM Federal Institute for Materials Research and Testing (Germany)
Vivien G. Schukar, BAM Federal Institute for Materials Research and Testing (Germany)
Wolfgang R. Habel, BAM Federal Institute for Materials Research and Testing (Germany)
Wolfgang R. Habel, BAM Federal Institute for Materials Research and Testing (Germany)
Published in SPIE Proceedings Vol. 8421:
OFS2012 22nd International Conference on Optical Fiber Sensors
Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao, Editor(s)
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